Abstract: To clarify the internal factors affecting wheat lodging resistance formation along Huaihe River，the relationship between wheat stem lodging resistance and related traits was discussed based on analyzing, the stem characteristics，internode morphological characteristics，basal two-internode mechanical characteristics， chemical composition， and anatomical structure of the selected 11 wheat varieties. The results showed that the wheat varieties with lower plant height， lower barycenter height， larger vascular bundles between the two internodes at the stem base，and thicker parenchyma had a higher lodging resistance index. Based on the anatomical structure of the stem between the second internode of the wheat base，QM725 and HC3366 had more vascular bundles，thicker parenchyma，more cell layers，more closely arranged cells，and higher lodging resistance index. In correlation analysis，the lodging resistance index of wheat was significantly negatively correlated with plant height， extremely significantly negatively correlated with barycenter height，significantly positively correlated with the number of large vascular bundles in the second internode of stem base，and positively correlated with the thickness of parenchyma. Under the conditions of this study，the plant is shorter，the stem barycenter height is lower，the cells are arranged closely between the two basal internodes，the number of large vascular bundles is more，the thickness of thin wall tissue is thicker，and the mechanical strength is large，which is beneficial to the formation of lodging resistance of wheat stem.

Key words: wheat, basal internode traits, lodging resistance, mechanical strength